Kun Shuai 1,2,3Yuanan Zhao 1,2,3,*Xiaofeng Liu 1,2,3,*Xiangkun Lin 1,2,3[ ... ]Jianda Shao 1,3,9
Author Affiliations
Abstract
1 Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (CAS), Shanghai, China
2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
3 Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai, China
4 School of Materials Science and Engineering, Wuhan University of Technology, Wuhan, China
5 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, China
6 School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai, China
7 National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai, China
8 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, China
9 Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, China
Multilayer dielectric gratings (MLDGs) are crucial for pulse compression in picosecond–petawatt laser systems. Bulged nodular defects, embedded in coating stacks during multilayer deposition, influence the lithographic process and performance of the final MLDG products. In this study, the integration of nanosecond laser conditioning (NLC) into different manufacturing stages of MLDGs was proposed for the first time on multilayer dielectric films (MLDFs) and final grating products to improve laser-induced damage performance. The results suggest that the remaining nodular ejection pits introduced by the two protocols exhibit a high nanosecond laser damage resistance, which remains stable when the irradiated laser fluence is more than twice the nanosecond-laser-induced damage threshold (nanosecond-LIDT) of the unconditioned MLDGs. Furthermore, the picosecond-LIDT of the nodular ejection pit conditioned on the MLDFs was approximately 40% higher than that of the nodular defects, and the loss of the grating structure surrounding the nodular defects was avoided. Therefore, NLC is an effective strategy for improving the laser damage resistance of MLDGs.
laser-induced damage threshold multilayer dielectric gratings nanosecond laser conditioning nodular defects picosecond–petawatt laser systems 
High Power Laser Science and Engineering
2023, 11(6): 06000e89
作者单位
摘要
1 中国科学技术大学国家同步辐射实验室,安徽 合肥 230029
2 安徽中科光栅科技有限公司,安徽 合肥 231605
随着同步辐射光源中光束线的分辨率不断提高,衍射光栅成为影响分辨率的关键因素,因此,在将光栅安装到光束线之前,需要进行准确的测试。用长程面形仪测量合肥光源光电子能谱线所需的变线距光栅的线密度,光栅衍射角变化范围超出长程面形仪的测量范围,因此采用拼接测量。用数据重叠测试及数据处理方法,消除了转台定位误差,有效抑制了随机误差,使光栅周期测量的重复性有较大提高。不同重叠率的测试结果显示,测量一致性优于1.13×10-6(RMS),满足了变线距光栅的测试需求。
测量 衍射测量 变线距光栅 拼接测量 长程面形仪 
光学学报
2023, 43(3): 0312007
Author Affiliations
Abstract
1 School of Materials Science and Engineering, Wuhan University of Technology, Wuhan, China
2 Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Shanghai, China
3 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, China
4 School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai, China
5 National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai, China
6 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, China
7 Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, China
Multilayer dielectric gratings typically remove multiple-grating pillars after picosecond laser irradiation; however, the dynamic formation process of the removal is still unclear. In this study, the damage morphologies of multilayer dielectric gratings induced by an 8.6-ps laser pulse were closely examined. The damage included the removal of a single grating pillar and consecutive adjacent grating pillars and did not involve the destruction of the internal high-reflection mirror structure. Comparative analysis of the two damage morphological characteristics indicated the removal of adjacent pillars was related to an impact process caused by the eruption of localized materials from the left-hand pillar, exerting impact pressure on its adjacent pillars and eventually resulting in multiple pillar removal. A finite-element strain model was used to calculate the stress distribution of the grating after impact. According to the electric field distribution, the eruptive pressure of the dielectric materials after ionization was also simulated. The results suggest that the eruptive pressure resulted in a stress concentration at the root of the adjacent pillar that was sufficient to cause damage, corresponding to the experimental removal of the adjacent pillar from the root. This study provides further understanding of the laser-induced damage behavior of grating pillars and some insights into reducing the undesirable damage process for practical applications.
grating pillar removal laser-induced damage multilayer dielectric gratings picosecond laser 
High Power Laser Science and Engineering
2022, 10(6): 06000e42
作者单位
摘要
1 中国科学院国家天文台南京天文光学技术研究所,江苏 南京 210042
2 中国科学院天文光学技术重点实验室(南京天文光学技术研究所),江苏 南京 210042
3 中国科学院大学,北京 100049
4 中国科学技术大学,安徽 合肥 230027
不同于国际上其他空间项目采用光栅切换的光谱获取方式,中国空间巡天望远镜采用近焦面拼接光栅的方式获取大视场、宽波段无缝光谱,波长覆盖范围为250~1000 nm,光谱分辨率R≥200。国内紫外透射衍射光栅的天文应用尚在起步阶段,制作难度高,且不能从国外获得。经过多年努力,光栅性能在近期获得了较大提升。本文针对紫外光栅的科学应用性能和使用条件,分析了衍射光栅制作参数的优化,给出了衍射效率随入射角、入射光偏振态以及光栅槽形结构参数的变化规律。相关数据对在轨流量定标具有借鉴价值。通过选用不同的光栅结构参数对衍射效率特性进行分析,发现了紫外光栅峰值波长与顶角投影在每个周期上的比值之间的近似线性表达关系。本文讨论了满足科学需求的参数许可域,并将其用于控制光栅制作参数。多次试验后,光栅槽形结构参数和形状得到了精确控制,获得了性能优异的衍射光栅。制作的光栅线密度为333 line/mm,闪耀角为12.51°,峰值效率波长控制在315 nm,紫外波段实测峰值衍射效率为72.3%,平均效率为65.1%。该光栅的槽形、波前质量等均控制在较高水平,衍射波前质量均方根(RMS)达到0.06λ,峰谷值(PV值)达到了0.33λ。采用该光栅可获得良好的成像质量。
光栅 光谱巡天 衍射效率 衍射波前 像质 
中国激光
2022, 49(6): 0611002
作者单位
摘要
中国科学技术大学国家同步辐射实验室, 安徽 合肥 230029
衍射光栅已被广泛应用于同步辐射光源软X射线与真空紫外光栅单色器中,光栅线密度偏差会直接影响单色器的性能。为了检测光栅线密度的偏差,本文在合肥先进光源预研过程中搭建了长程面形仪(LTP)系统。使用自准直仪对LTP检测光栅系统在26 μrad内的检测精度进行了标定。利用LTP对自主研制的760 line/mm与2400 line/mm等间距光栅进行线密度均匀性检测,使用干涉仪对760 line/mm光栅进行0级与1级衍射波前检测,并将检测结果与LTP测量结果进行比较。结果表明:系统标定的均方根误差为30 nrad,与干涉仪检测结果相比,两者同位置处的高度轮廓曲线具有较好的一致性。这说明搭建的LTP系统具有较高精度的检测光栅线密度的能力,为检测同步辐射光栅线密度的变化提供了平台。
测量 长程面形仪 等间距光栅 线密度均匀性 
光学学报
2021, 41(6): 0612002
作者单位
摘要
1 中国工程物理研究院 应用电子学研究所,四川 绵阳 621900
2 清华大学 精密仪器系 精密测试技术及仪器国家重点实验室,北京 100084
3 中国科学技术大学 国家同步辐射实验室,合肥 230029
4 苏州大学 光电科学与工程学院,江苏 苏州 215006
分析了基于锥面衍射的双光栅光谱合成系统的可行性,设计了激光入射角为Littrow角附近的双多层介质膜(MLD)光栅光谱合成系统,开展了两路合成实验。当入射极角等于自准直入射角,入射方位角为6°时,光栅衍射效率近似等于光束自准直入射时的衍射效率。基于锥面衍射原理,对中心波长为1050.24 nm和1064.33 nm的两束光纤激光子束进行合成,入射极角为43.99°,测得合成效率为92.9%,较基于非锥面衍射的双光栅光谱合成系统的合成效率提高了8.8%;测得合成光斑光束质量Mx2=1.204,My2=1.467,与基于非锥面衍射的双光栅光谱合成系统输出光斑光束质量基本一致。
锥面衍射 非锥面衍射 双MLD光栅 光谱合成 合成效率 conical diffraction non-conical diffraction dual-MLD gratings spectral beam combining combining efficiency 
强激光与粒子束
2020, 32(12): 121006
Author Affiliations
Abstract
1 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
2 Institut für Angewandte Physik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, Jena 07743, Germany
3 Technische Universität Braunschweig, Laboratory for Emerging Nanometrology, Pockelsstr. 14, Braunschweig 38106, Germany
4 Physikalisch-Technische Bundesanstalt, Bundesallee 100, Braunschweig 38116, Germany
Near-field holography (NFH), with its virtues of precise critical dimensions and high throughput, has a great potential for the realization of soft x-ray diffraction gratings. We show that NFH with reflections reduced by the integration of antireflective coatings (ARCs) simplifies the NFH process relative to that of setups using refractive index liquids. Based on the proposed NFH with ARCs, gold-coated laminar gratings were fabricated using NFH and subsequent ion beam etching. The efficiency angular spectrum shows that the stray light of the gratings is reduced one level of magnitude by the suppression of interface reflections during NFH.
050.1950 Diffraction gratings 120.4610 Optical fabrication 220.4000 Microstructure fabrication 340.7480 X-rays, soft x-rays, extreme ultraviolet (EUV) 
Chinese Optics Letters
2016, 14(9): 090501
作者单位
摘要
1 中国科学技术大学 国家同步辐射实验室, 合肥 230029
2 安徽大学 物理与材料科学学院, 合肥 230601
针对大面积衍射光学元件制作过程中对光刻胶均匀涂覆的困难,研究弯月面均匀涂胶方法。利用沟槽型弯月面涂胶机,分析影响光刻胶厚度和厚度均匀性的因素。从实验上验证了光刻胶的胶厚和涂覆扫描速率的正相关关系。分析了光刻胶的浓度、基片与涂覆器刀口间隙、供胶速率等因素对胶厚及胶厚均匀性的影响。利用非接触式的激光微位移传感器监测基片和涂覆器刀口间隙,控制此间隙的抖动小于15 μm,优化系统运行的稳定性,提升了弯月面涂覆胶厚的均匀性,实现了胶厚峰谷值偏差3%和标准偏差0.5%的均匀光刻胶涂覆,能够满足脉宽压缩光栅等制作过程中对光刻胶均匀涂覆的需求。
弯月面涂胶 大面积衍射光学元件 光刻胶均匀涂覆 meniscus coating large area diffractive optic plates photoresist uniformity coating 
强激光与粒子束
2015, 27(12): 121003
作者单位
摘要
中国科学技术大学国家同步辐射实验室, 安徽 合肥 230029
结合单晶硅各向异性腐蚀和倾斜光刻技术,在14°斜切(110)单晶硅片上成功制作出90°顶角的中阶梯光栅。在1500~1600 nm波段对其进行了闪耀级次衍射效率测量,测量结果的趋势与C方法计算结果基本吻合,其中在1500~1550 nm波段光栅表现出良好的闪耀特性,效率为理论值的52%~75%,峰值约为58%。讨论并计算了制作工艺中的槽深误差对光栅闪耀级次衍射效率的影响。结果表明,在1500~1550 nm波段,考虑槽深误差计算所得的理论闪耀级次衍射效率约为完美槽形计算效率的77%~85%。
光栅 中阶梯光栅 单晶硅 各向异性腐蚀技术 光刻技术 
光学学报
2014, 34(9): 0905001
作者单位
摘要
中国科学技术大学 国家同步辐射实验室, 合肥 230029
作为强激光系统的终端组件之一,光束采样光栅是制作在熔石英基底上的浅槽光栅。利用熔石英的传统化学机械抛光技术,修正熔石英光束采样光栅的槽型轮廓,降低局部偏高的衍射效率,以提高光束采样光栅的整体效率均匀性。利用此方法已成功将430 mm×430 mm的光束采样光栅的衍射效率均方根值(RMS)由30%附近降低到5%以下。实验结果显示,利用传统化学机械抛光技术可以有效提高光束采样光栅衍射效率均匀性,这是一种可行的技术方案。
光束采样光栅 衍射效率 均匀性 化学机械抛光 beam sampling grating diffraction efficiency uniformity chemical mechanical polishing 
强激光与粒子束
2013, 25(7): 1609

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